Griffoni, AlessioAlessioGriffoniSilvestri, MarcoMarcoSilvestriGerardin, SimoneSimoneGerardinMeneghesso, GaudenzioGaudenzioMeneghessoPaccagnella, AlessandroAlessandroPaccagnellaKaczer, BenBenKaczerde Potter de ten Broeck, MurielMurielde Potter de ten BroeckVerbeeck, RitaRitaVerbeeckNackaerts, AxelAxelNackaerts2021-10-172021-10-1720090018-9499https://imec-publications.be/handle/20.500.12860/15397Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-raysJournal article