A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM Applications

Rao, SiddharthSiddharthRaoCouet, SebastienSebastienCouetVan Beek, SimonSimonVan BeekKundu, ShreyaShreyaKunduHoushmand Sharifi, ShaminShaminHoushmand SharifiJossart, NicoNicoJossartKar, Gouri SankarGouri SankarKar2022-02-082021-11-022022-02-0820212079-9292WOS:000709783600001https://imec-publications.be/handle/20.500.12860/37441A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM ApplicationsJournal article10.3390/electronics10192384WOS:000709783600001