van der Sluis, OlafOlafvan der SluisHsu, Yung-YuYung-YuHsuTimmermans, P.H.M.P.H.M.TimmermansGonzalez, MarioMarioGonzalezHoefnagels, J.P.M.J.P.M.Hoefnagels2021-10-182021-10-182009https://imec-publications.be/handle/20.500.12860/16375Numerical and experimental analysis of stretching induced interconnect delaminationOral presentation