An improved free-space technique modelling for measuring dielectric properties of materials

Dhondt, GeertGeertDhondtDe Zutter, DanielDanielDe ZutterMartens, LucLucMartens2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1208An improved free-space technique modelling for measuring dielectric properties of materialsProceedings paper