Van Steenkiste, TomTomVan Steenkistevan der Herten, JoachimJoachimvan der HertenDeschrijver, DirkDirkDeschrijverDhaene, TomTomDhaene2021-10-272021-10-272019-040177-0667https://imec-publications.be/handle/20.500.12860/34277ALBATROS: adaptive line-based sampling trajectories for sequential measurementsJournal articlehttps://doi.org/10.1007/s00366-018-0614-6