Measurement uncertainty propagation in transistor model parameters via polynomial chaos expansion

Petrocchi, AlessandraAlessandraPetrocchiKaintura, ArunArunKainturaAvolio, GustavoGustavoAvolioSpina, DomenicoDomenicoSpinaDhaene, TomTomDhaeneRaffo, AntonioAntonioRaffoSchreurs, DominiqueDominiqueSchreurs2021-10-242021-10-2420171531-1309https://imec-publications.be/handle/20.500.12860/29165Measurement uncertainty propagation in transistor model parameters via polynomial chaos expansionJournal articlehttp://ieeexplore.ieee.org/document/7934068/