Simoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaVan der Plas, GeertGeertVan der PlasClaeys, CorCorClaeys2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19791Low-frequency noise assessment of CMOS transistros with a through-silicon viaProceedings paper