Brammertz, GuyGuyBrammertzLin, H.C.H.C.LinMartens, KoenKoenMartensMercier, DavidDavidMercierMerckling, ClementClementMercklingPenaud, JulienJulienPenaudAdelmann, ChristophChristophAdelmannSioncke, SonjaSonjaSionckeWang, Wei-EWei-EWangCaymax, MattyMattyCaymaxMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13445Capacitance-voltage (CV)characterization of GaAs-oxide interfacesProceedings paperhttp://www.ecsdl.org/getabs/servlet/GetabsServlet?prog=normal&id=ECSTF8000016000005000507000001&idtype=cvips&gifs=Yes