A BSIM-Based Predictive Hot-Carrier Aging Compact Model

Xiang, YangYangXiangTyaginov, StanislavStanislavTyaginovVandemaele, MichielMichielVandemaeleWu, ZhichengZhichengWuFranco, JacopoJacopoFrancoBury, ErikErikBuryTruijen, BrechtBrechtTruijenParvais, BertrandBertrandParvaisLinten, DimitriDimitriLintenKaczer, BenBenKaczer2022-03-112022-03-1120211541-7026WOS:000672563100131https://imec-publications.be/handle/20.500.12860/39420A BSIM-Based Predictive Hot-Carrier Aging Compact ModelProceedings paper10.1109/IRPS46558.2021.9405222978-1-7281-6893-7WOS:000672563100131DEGRADATION