Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates

Collaert, NadineNadineCollaertAoulaiche, MarcMarcAoulaicheRakowski, MichalMichalRakowskiDe Wachter, BartBartDe WachterBourdelle, K.K.BourdelleNguyen, B.-Y.B.-Y.NguyenBoedt, F.F.BoedtDelprat, D.D.DelpratJurczak, GosiaGosiaJurczak2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/15123Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substratesProceedings paper