Soft gate oxide breakdown as a lifetime-limiting event in dynamic CMOS logic

Kaczer, BenBenKaczerGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152003-12https://imec-publications.be/handle/20.500.12860/7716Soft gate oxide breakdown as a lifetime-limiting event in dynamic CMOS logicProceedings paper