Marinissen, Erik JanErik JanMarinissenZorian, YervantYervantZorian2021-10-182021-10-1820090740-7475https://imec-publications.be/handle/20.500.12860/15832IEEE 1500 enables modular SOC testingJournal articlehttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=4760111&isnumber=4760105