Ullrick, ThijsThijsUllrickDeschrijver, DirkDirkDeschrijverBogaerts, WimWimBogaertsDhaene, TomTomDhaene2025-06-102025-03-142025-03-172025-06-102024979-8-3503-5124-82165-4107WOS:001422987500043https://imec-publications.be/handle/20.500.12860/45395Modeling Microwave S-parameters using Frequency-scaled Rational Gaussian Process KernelsProceedings paper10.1109/EPEPS61853.2024.10754263979-8-3503-5123-1WOS:001422987500043