Acurio Mendez, ElianaElianaAcurio MendezTrojman, LionelLionelTrojmanCrupi, FeliceFeliceCrupiMoposita,MopositaDe Jaeger, BriceBriceDe JaegerDecoutere, StefaanStefaanDecoutere2021-10-282021-10-2820201530-4388https://imec-publications.be/handle/20.500.12860/34590Reliability assessment of AlGaN/GaN Schottky barrier diodes under ON-state stressJournal articlehttps://ieeexplore.ieee.org/document/8970266