Toledano Luque, MariaMariaToledano LuqueKaczer, BenBenKaczerSimoen, EddyEddySimoenRoussel, PhilippePhilippeRousselVeloso, AnabelaAnabelaVelosoGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-1920110167-9317https://imec-publications.be/handle/20.500.12860/19900Temperature and voltage dependences of the capture and emission times of individual traps in high-k dielectricsJournal article