New insights into the relation between channel hot carrier degradation and oxide breakdown in short channel nMOSFETs

Crupi, FeliceFeliceCrupiKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroesenekenDe Keersgieter, AnAnDe Keersgieter2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7367New insights into the relation between channel hot carrier degradation and oxide breakdown in short channel nMOSFETsJournal article