High-throughput magnetic metrology for spintronic CMOS integration

Yan, JingdongJingdongYanManfrini, MauricioMauricioManfriniRadisic, DunjaDunjaRadisicCiubotaru, FlorinFlorinCiubotaruWilson, ChrisChrisWilsonRadu, IulianaIulianaRaduThean, AaronAaronThean2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27621High-throughput magnetic metrology for spintronic CMOS integrationMeeting abstract