Kazemi Esfeh, BabakBabakKazemi EsfehKilchytska, ValeriaValeriaKilchytskaParvais, BertrandBertrandParvaisPlanes, N.N.PlanesHaond, MMHaondFlandre, DDFlandreRaskin, J.-P.J.-P.Raskin2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28651Back-gate bias effect on FDSOI MOSFET RF figures of merits and parasitic elementsProceedings paperhttp://ieeexplore.ieee.org/document/7962569/