Calibration of PIXE yields using Cu as a reference

Harayama, IsaoIsaoHarayamaSekiba, DaichiroDaichiroSekibaZhao, QiangQiangZhaoVantomme, AndreAndreVantommeVandervorst, WilfriedWilfriedVandervorstMeersschaut, JohanJohanMeersschaut2021-10-242021-10-2420170168-583Xhttps://imec-publications.be/handle/20.500.12860/28458Calibration of PIXE yields using Cu as a referenceJournal articlehttp://www.sciencedirect.com/science/article/pii/S0168583X17301684