Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique

Hehenberger, PhilippPhilippHehenbergerAichinger, ThomasThomasAichingerGrasser, TiborTiborGrasserGoes, WolfgangWolfgangGoesTriebl, O.O.TrieblKaczer, BenBenKaczerNelhiebel, M.M.Nelhiebel2021-10-172021-10-172009-04https://imec-publications.be/handle/20.500.12860/15448Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement techniqueProceedings paper