Root cause of charge loss in nitride-based localized trapping memory cell

Furnemont, ArnaudArnaudFurnemontRosmeulen, MaartenMaartenRosmeulenvan der Zanden, KoenKoenvan der ZandenVan Houdt, JanJanVan HoudtDe Meyer, KristinKristinDe MeyerMaes, HermanHermanMaes2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12178Root cause of charge loss in nitride-based localized trapping memory cellJournal article