Scanning probe microscopy of 1-D and 2-D carrier distributions

Stephenson, RobertRobertStephensonDe Wolf, PeterPeterDe WolfTrenkler, ThomasThomasTrenklerHantschel, ThomasThomasHantschelClarysse, TrudoTrudoClarysseVandervorst, WilfriedWilfriedVandervorst2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2975Scanning probe microscopy of 1-D and 2-D carrier distributionsOral presentation