Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions

Griffoni, AlessioAlessioGriffoniZuber, PaulPaulZuberDobrovolny, PetrPetrDobrovolnyRoussel, PhilippePhilippeRousselLinten, DimitriDimitriLintenAlles, Michael L.Michael L.AllesSchrimpf, Ronald D.Ronald D.SchrimpfReed, Robert A.Robert A.ReedKobayashi, DaisukeDaisukeKobayashiSimoen, EddyEddySimoenGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19011Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditionsProceedings paper