Sikula, J.J.SikulaHruska, P.P.HruskaVasina, PetrPetrVasinaClaeys, CorCorClaeysSimoen, EddyEddySimoenMatulionis, A.A.MatulionisStadalnikas, A.A.StadalnikasPalenskis, V.V.Palenskis2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1478High frequency RTS noise in submicron MOSFETsProceedings paper