Transmission line characterization on silicon considering arbitrary distribution of the series and shunt pad parasitics

Torres-Torres, ReydezelReydezelTorres-TorresVenegas, RafaelRafaelVenegasDecoutere, StefaanStefaanDecoutere2021-10-182021-10-1820100038-1101https://imec-publications.be/handle/20.500.12860/18102Transmission line characterization on silicon considering arbitrary distribution of the series and shunt pad parasiticsJournal articlewww.elsevier.com/locate/sse