Characterization of a point-contact on silicon using force microscopy-supported resistance measurements

De Wolf, PeterPeterDe WolfSnauwaerts, JanJanSnauwaertsClarysse, TrudoTrudoClarysseVandervorst, WilfriedWilfriedVandervorstHellemans, L.L.Hellemans2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/602Characterization of a point-contact on silicon using force microscopy-supported resistance measurementsJournal article