Recent trends in CMOS reliability: from individual traps to circuit simulations

Kaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueFranco, JacopoJacopoFrancoGrasser, TiborTiborGrasserRoussel, PhilippePhilippeRousselCamargo, Vinicius V. A.Vinicius V. A.CamargoMahato, SwarajSwarajMahatoSimoen, EddyEddySimoenWirth, Gilson I.Gilson I.WirthGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19149Recent trends in CMOS reliability: from individual traps to circuit simulationsOral presentation