Herrera-Gomez, AlbertoAlbertoHerrera-GomezCant, David J. H.David J. H.CantConard, ThierryThierryConardRenault, OlivierOlivierRenaultLinford, Matthew R.Matthew R.LinfordPinder, Joshua W.Joshua W.PinderFenton, JeffJeffFentonBaer, Donald R.Donald R.Baer2024-10-092024-07-062024-10-0920240142-2421WOS:001257504900001https://imec-publications.be/handle/20.500.12860/44130New challenges associated with hard X-ray photoelectron spectroscopy (report on the 2023 ASTM E42-ASSD AVS workshop)Journal article10.1002/sia.7340WOS:001257504900001ANGLE-RESOLVED XPSELECTRONCALIBRATIONSCATTERINGAES