Crupi, FeliceFeliceCrupiIannaccone, G.G.IannacconeCrupi, IsodianaIsodianaCrupiDegraeve, RobinRobinDegraeveGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5173Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate currentJournal article