Thermal, structural and electrical study of the effect of annealing on the passivation by amorphous silicon of n-type crystalline (100) silicon surfaces

Meddeb, HosnyHosnyMeddebBearda, TwanTwanBeardaAbdelwahab, IbrahimIbrahimAbdelwahabFerro, ValentinaValentinaFerroO'Sullivan, BarryBarryO'SullivanAbdulraheem, YaserYaserAbdulraheemEzzaouia, HatemHatemEzzaouiaGordon, IvanIvanGordonSzlufcik, JozefJozefSzlufcikPoortmans, JefJefPoortmans2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24231Thermal, structural and electrical study of the effect of annealing on the passivation by amorphous silicon of n-type crystalline (100) silicon surfacesProceedings paperhttp://www.sciencedirect.com/science/article/pii/S1876610214012892