Cheng, C.K.C.K.ChengKahng, A.B.A.B.KahngLiu, BaoBaoLiuStroobandt, DirkDirkStroobandt2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6104Toward better wireload models in the presence of obstaclesJournal article