Improved model to determine the generation lifetime in double gate SOI nMOSFETs

Galeti, M.M.GaletiMartino, J.A.J.A.MartinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12180Improved model to determine the generation lifetime in double gate SOI nMOSFETsProceedings paper