Degraeve, RobinRobinDegraevePangon, NadègeNadègePangonKaczer, BenBenKaczerNigam, TanyaTanyaNigamGroeseneken, GuidoGuidoGroesenekenNaem, AbdallaAbdallaNaem2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3397Temperature acceleration of oxide breakdown and its impact on ultra-thin gate oxide reliabilityProceedings paper