Linten, DimitriDimitriLintenVashchenko, VladVladVashchenkoScholz, MirkoMirkoScholzJansen, PhilippePhilippeJansenLafonteese, DavidDavidLafonteeseThijs, StevenStevenThijsSawada,SawadaHasebe,HasebeHopper, PeterPeterHopperGroeseneken, GuidoGuidoGroeseneken2021-10-172021-10-172008-09https://imec-publications.be/handle/20.500.12860/14044Extreme voltage and current overshoots in HV snapback devices during HBM ESD stressProceedings paper