Millesimo, M.M.MillesimoBorga, MatteoMatteoBorgaBakeroot, BenoitBenoitBakerootPosthuma, NielsNielsPosthumaDecoutere, StefaanStefaanDecoutereSangiorgi, E.E.SangiorgiFiegna, C.C.FiegnaTallarico, A. N.A. N.Tallarico2022-11-252022-11-142022-11-2520220741-3106WOS:000876041700017https://imec-publications.be/handle/20.500.12860/40730The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTsJournal article10.1109/LED.2022.3206610WOS:000876041700017PERCOLATION THEORYTHRESHOLD VOLTAGEBREAKDOWNTECHNOLOGY