Eneman, GeertGeertEnemanRoussel, PhilippePhilippeRousselBrunco, DavidDavidBruncoCollaert, NadineNadineCollaertMocuta, AndaAndaMocutaThean, AaronAaronThean2021-10-232021-10-2320160021-8979https://imec-publications.be/handle/20.500.12860/26601Band offsets in biaxially stressed SiGe layers for arbitrary orientationsJournal articlehttp://scitation.aip.org/content/aip/journal/jap/120/5/10.1063/1.4960140