Sarkar, MukulMukulSarkarSan Segundo Bello, DavidDavidSan Segundo BelloVan Hoof, ChrisChrisVan HoofTheuwissen, AlbertAlbertTheuwissen2021-10-192021-10-1920111530-437Xhttps://imec-publications.be/handle/20.500.12860/19733Integrated polarization analyzing CMOS image sensor for material classificationJournal article