Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability

Martin-Martinez, JavierJavierMartin-MartinezDiaz Fortuny, JavierJavierDiaz FortunySaraza Canflanca, PabloPabloSaraza CanflancaRodriguez, RosanaRosanaRodriguezCastro-Lopez, RafaelRafaelCastro-LopezRoca, ElisendaElisendaRocaFernandez, Francisco V.Francisco V.FernandezNafria, MontserratMontserratNafria2024-04-042023-07-152024-04-0420231541-7026WOS:001007431500177https://imec-publications.be/handle/20.500.12860/42164Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variabilityProceedings paper10.1109/IRPS48203.2023.10118334978-1-6654-5672-2WOS:001007431500177STATISTICAL CHARACTERIZATIONDEVICEDEGRADATIONBTI