Cristofani, EdisonEdisonCristofaniBecquaert, MathiasMathiasBecquaertPandey, GokarnaGokarnaPandeyVandewal, MarijkeMarijkeVandewalDeligiannis, NikosNikosDeligiannisStiens, JohanJohanStiens2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26484Compressed sensing and defect-based dictionaries for characteristics extraction in MM-wave non-destructive testingProceedings paperhttp://ieeexplore.ieee.org/document/7758678/