Trenkler, ThomasThomasTrenklerDe Wolf, PeterPeterDe WolfSnauwaerts, JanJanSnauwaertsQamhieh, Z.Z.QamhiehVandervorst, WilfriedWilfriedVandervorstHellemans, L.L.Hellemans2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/918Local potential measurements in silicon devices using atomic force microscopy with conductive tipsProceedings paper