Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies

Bosman, DriesDriesBosmanHuynen, MartijnMartijnHuynenDe Zutter, DanielDanielDe ZutterSun, XiaoXiaoSunPantano, NicolasNicolasPantanoVan Der Plas, GeertGeertVan Der PlasBeyne, EricEricBeyneGinste, Dries VandeDries VandeGinste2023-07-242023-03-182023-07-2420230018-9480WOS:000940168700001https://imec-publications.be/handle/20.500.12860/41303Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect TopologiesJournal article10.1109/TMTT.2023.3244205WOS:000940168700001TRANSMISSION-LINE PARAMETERSINTEGRAL-EQUATIONLOSSY CONDUCTORSSERIES IMPEDANCESKIN