Radhakrishnan, M. K.M. K.RadhakrishnanVassilev, VesselinVesselinVassilevKeppens, BartBartKeppensDe Heyn, VincentVincentDe HeynMahadeva Iyer, NatarajanNatarajanMahadeva IyerGroeseneken, GuidoGuidoGroeseneken2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6749ESD reliability issues in RF CMOS circuitsProceedings paper