Afanasiev, ValeriValeriAfanasievHoussa, MichelMichelHoussaStesmans, AndreAndreStesmansMerckling, ClementClementMercklingSchram, TomTomSchramKittl, JorgeJorgeKittl2021-10-192021-10-1920110003-6951https://imec-publications.be/handle/20.500.12860/18453Influence of Al2O3 crystallization on band offsets at interfaces with Si and TiNxJournal article