Electrical characterization of the metal-vanadium dioxide interface and implications for memory applications

Martens, KoenKoenMartensRadu, IulianaIulianaRaduMertens, SofieSofieMertensShi, XiaopingXiaopingShiSchaekers, MarcMarcSchaekersTielens, HildeHildeTielensHuyghebaert, CedricCedricHuyghebaertDe Gendt, StefanStefanDe GendtJurczak, GosiaGosiaJurczakAfanasev, ValeriValeriAfanasevHeyns, MarcMarcHeynsKittl, JorgeJorgeKittl2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19394Electrical characterization of the metal-vanadium dioxide interface and implications for memory applicationsOral presentation