Pixel-wise beam-hardening correction for dark-field signal in X-ray dual-phase grating interferometry

Tang, RuizhiRuizhiTangOrganista, CaoriCaoriOrganistaRomano, LuciaLuciaRomanovan Hoorebeke, LucLucvan HoorebekeStampanoni, MarcoMarcoStampanoniAelterman, JanJanAeltermanBoone, Matthieu n.Matthieu n.Boone2024-01-152024-01-082024-01-1520231094-4087WOS:001125057700004https://imec-publications.be/handle/20.500.12860/43364Pixel-wise beam-hardening correction for dark-field signal in X-ray dual-phase grating interferometryJournal article10.1364/OE.499397WOS:001125057700004VISIBILITY-CONTRASTMEDLINE:38041345