Liu, Hsiao-HsuanHsiao-HsuanLiuSalahuddin, Shairfe MuhammadShairfe MuhammadSalahuddinAbdi, DawitDawitAbdiChen, RongmeiRongmeiChenWeckx, PieterPieterWeckxMatagne, PhilippePhilippeMatagneCatthoor, FranckyFranckyCatthoor2023-05-162022-05-042023-05-1620220018-9383WOS:000785777900001https://imec-publications.be/handle/20.500.12860/39729Extended Methodology to Determine SRAM Write Margin in Resistance-Dominated Technology NodeJournal article10.1109/TED.2022.3165738WOS:000785777900001