Celano, UmbertoUmbertoCelanoGoux, LudovicLudovicGouxBelmonte, AttilioAttilioBelmonteSchulze, AndreasAndreasSchulzeOpsomer, KarlKarlOpsomerDetavernier, ChristophChristophDetavernierRichard, OlivierOlivierRichardBender, HugoHugoBenderJurczak, GosiaGosiaJurczakVandervorst, WilfriedWilfriedVandervorst2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22113Conductive-AFM tomography for 3D filament observation in resistive switching devicesProceedings paper