Emerging yield and reliability challenges in nanometer CMOS technologies

Gielen, GeorgesGeorgesGielenDe Wit, Pieter J.H.Pieter J.H.De WitMaricau, ElieElieMaricauLoeckx, J.J.LoeckxMartin-Martinez, JoseJoseMartin-MartinezKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroesenekenRodriguez, RosannaRosannaRodriguezNafria, MontserratMontserratNafria2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13770Emerging yield and reliability challenges in nanometer CMOS technologiesProceedings paperhttp://ieeexplore.ieee.org/iel5/4475437/4484624/04484862.pdf?tp=&arnumber=4484862&isnumber=4484624