Results of noise examination of fully-depleted accumulation-mode SOI pMOSFETs

Lukyanchikova, N.N.LukyanchikovaPetrichuk, M.M.PetrichukGarbar, N.N.GarbarSimoen, EddyEddySimoenClaeys, C.C.Claeys2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/737Results of noise examination of fully-depleted accumulation-mode SOI pMOSFETsProceedings paper