Temperature and frequency dependent electrical characterization of HfO2/InxGa1xAs interfaces using capacitance-voltage and conductance methods

O'connor, EamonEamonO'connorMonaghan, S.S.MonaghanLong, R.D.R.D.LongO'Mahony, A.A.O'MahonyPovey, I.M.I.M.PoveyCherkaoui, K.K.CherkaouiPemble, M.E.M.E.PembleBrammertz, GuyGuyBrammertzHeyns, MarcMarcHeynsNewcomb, S.S.NewcombAfanasiev, ValeriValeriAfanasievHurley, P.P.Hurley2021-10-182021-10-182009-030003-6951https://imec-publications.be/handle/20.500.12860/15936Temperature and frequency dependent electrical characterization of HfO2/InxGa1xAs interfaces using capacitance-voltage and conductance methodsJournal articlehttp://scitation.aip.org/vsearch/servlet/VerityServlet?KEY=APPLAB&ONLINE=YES&smode=strresults&sort=chron&maxdisp=25&threshold=0&